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Yelo were in attendance at the second annual PIC International Conference in Brussels (7-8th March 2017).
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Laser diode burn-in and life test equipment manufacturers Yelo were in attendance at the EPIC (European Photonics Industry Consortium) meeting on PIC Testing in Pisa last week (16-17 February 2017).
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To keep pace with an increase in the demand for high-performance optical components, producers will need to consider automation of their processes in more detail. Dylan J. Burke of Yelo – a firm specialising in automated device measurement – looks at what’s driving the market and discusses the challenges that device makers face in relation to burn-in and test of devices at high volume. Included in his review are examples of the developments Yelo has been working on to help PIC firms in ramping up production.
Leading laser diode burn-in specialists Yelo will be attending PIC International Conference in Brussels, Belgium.
Yelo are proud to announce that we have been chosen as a finalist for the 2017 Photonic Integrated Circuit Awards in the "Device Characterization" category for our efforts in providing greater insight into chip level performance.
