Laser diode burn-in and life test equipment manufacturers Yelo were in attendance at the EPIC (European Photonics Industry Consortium) meeting on PIC Testing in Pisa last week (16-17 February 2017).
The primary scope of the event was to discuss and list requirements for PIC testing, differentiating also where, how, and what has to be tested in the whole PICs manufacturing chain. The discussion ranged from probing techniques to handling and test procedures and also touched briefly on the needs and requirements for dedicated modular instrumentation.
Dylan Burke (below) from Yelo delivered a presentation on burn-in and life test of optical devices and how Yelo’s solutions help device manufacturers to deliver reliable devices to the market in volume.
The two day event included a walk around Piazza dei Miracoli/Piazza del Duomo (Leaning tower of Pisa) followed by a delicious dinner at Ristorante Pizzeria Duomo.
Yelo would like to thank EPIC for arranging such a well organized and informative event.
