Yelo are proud to announce that we have been chosen as a finalist for the 2017 Photonic Integrated Circuit Awards in the "Device Characterization" category for our efforts in providing greater insight into chip level performance.
Yelo's automated burn-in and test systems are widely used in the telecommunications and data center markets to burn-in and test diode lasers and help device makers get the valuable reliability data they need as outlined in the Telcordia G468 document. Yelo's systems are fully automated and are helping device makers scales up their production lines in order to meet the huge demand that has come as a result of the growth of the 100G Data Center.
The PIC Awards will take place on the 7th March 2017 in Brussels in align with the PIC International Conference.
Voting is now open and we kindly ask that you cast you vote for Yelo HERE
