From 5-8 March 2017, Matthew Boyd, Mechanical Design Engineer at Yelo was in attendance at the Burn-in and Test Strategies (BITS) Workshop in Arizona.
BiTS is the leading event for the test of packaged integrated circuits (ICs). BiTS is dedicated to providing a forum for the latest information on a broad range of test topics including final, wafer sort, and burn-in.
The presentation sessions and tutorials included;
- Process Improvements to Increase Burn-In Yield and Quality
- Device Characterization Over Temperature at the Board Level
- 100G Testing Fixture Design and Verification
Yelo would like to thank the organizers of BiTS for a well planned event with lots of great sessions and networking opportunities.
