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Laser Diode Burn In

LASER DIODE BURN IN

What is Laser Reliability Testing?

Laser reliability testing consists of a series of tests that laser diodes can be put under in order to ensure their reliability for post-production use. There are different types of tests that can be carried out and there are multiple measurements that can be taken in order to evaluate the reliability of the device. One of these tests is laser diode burn-in.

What is Laser Diode Burn In?

Burn-in tests are applied to laser diodes during their manufacturing process to identify potentially defective devices. this early detection allows for a large decrease in infant mortality rates of the devices reaching post-production. In other words, they can be used to screen out lasers with short life expectancies.

All laser diodes are subjected to burn-in testing during manufacturing. Its aim is to identify and remove any defective devices at an early stage which would later suffer from infant mortality. Screening out laser diodes with short life expectancies involves burn-in testing the devices at high temperatures. This will lead to an improved level of reliability among the remaining lasers. Burn-in testing can greatly increase test cycle times and manufacturing costs. It is therefore common that laser diodes have burn-in tests that run for under 100 hours. A laser diode is screened out through burn-in tests if a change in one or more of the operating parameters is detected. These key operating parameters are measured both before and after the high temperature burn-in tests. It is important during testing that the temperature and operating current are as high as possible to minimise the time required for test completion. However, it is also important to avoid setting them too high that the laser degrades in a manner that would not be present during normal operating conditions.

There are two main ways to conduct burn-in tests:
BURN-IN TEST WITH SITU
At low testing volumes, or if the same system is used for burn-in and the engineering evaluation of a device it can be more cost effective to perform device parameter tests in the same system as burn-in. Yelo's burn-in systems are capable of burn-in with in-situ testing.
BURN-IN WITH SEPARATE TEST
In contrast to low production volumes, it is usually more cost effective to use constant current and temperature burn-in chambers, separate from the system used for device parameter testing. This can also allow for spectrum measurement incorporation to the testing process, as this becomes difficult to achieve when using an in-situ system.

What Problems Can Laser Diode Burn-In Solve?

High Infant Mortality Rates

A common problem in the photonics industry can be high rates of infant mortality failures in laser diodes. These are often caused by defects introduced during the manufacturing stage of the devices. Through use of Yelo's test systems, the number of these defective devices reaching end-of-production can be reduced.

Weak Links in Manufacturing

Laser diode burn-in can help uncover any weak links that may arise during manufacturing. The tests can run continuously for 10,000 hours thanks to Yelo's laser drive cards.

Our Burn-In Systems

Yelo have two rack based test systems capable of performing Burn-in:
Y1000L -
Designed for Low Power Laser Diodes up to 1A
Y2000H -
Designed for High Powered Laser Diodes up to 500A

Burn-In System Specification

The Y1000L is a universal tester capable of burn-in ageing and life-time testing multiple photonic devices at the same time. This means any photonic device, any package style and using any test recipe including temperature, current, voltage or optical power, all within the same system.

  • Current ranges available up to 1A
  • Test temperatures range between 25ºC and175ºC
  • monitored burn-in with ACC, APC and LIV test modes
  • Temperature control by air and heater plate
The Y1000LP is a laser diode and photodiode burn-in test system. In comparison to the Y1000L it is designed specifically for high volume production testing. Generally it is designed for testing the same device, but can be flexible and test multiple devices simultaneously if necessary. It offers cost advantages over the Y1000L for large scale testing.

  • Current ranges available up to 1A
  • Test temperatures range between 25ºC and 175ºC
  • Supports standard constant current (ACC) testing
  • Temperature control by air and heater plate
The Y2000H is a water cooled burn-in and life-test system for medium to high powered laser between 1A and 300A of current. the Y2000H allows testing on up to 4 different package types at the same time in the same system. It is often used by companies in the military and materials processing industry.

  • Current range up to 300A
  • Test temperatures between 25ºC and 50ºC
  • Monitored burn-in with ACC and LIV test modes
  • Water cooled base plate for thermal management
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